A Maximum Likelihood Estimator for ADC and DAC Linearity Testing
نویسندگان
چکیده
Abstrac t-The paper illustrates a method for simultaneous ADC and DAC linearity testing in a loopback scheme. The main features of the method are: (i) it is statistically nearly optimal, being based on a maximum likelihood estimator; (ii) it does not require prior knowledge neither of the ADC nonlinearity, nor of the DAC nonlinearity – both are simultaneously measured relying only on a constant-variance noise. The performances of the method are studied both mathematically and via computer simulations. The method, because of its optimality and universality, appears to be also a good candidate for inclusion in technical standards relevant to ADC and DAC testing.
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